1 article(s) from Telychko, Mykola

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

  • Mykola Telychko,
  • Jan Berger,
  • Zsolt Majzik,
  • Pavel Jelínek and
  • Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

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Published 07 Apr 2015
 
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